/*
* lambda-test.c
*
* Unit tests for the lambda project.
*
* Created on: 04.03.2015
* Author: dode@luniks.net
*
* DISCLAIMER: I'm new to C.
*
* ATTRIBUTION: This project includes the module USART and the Makefile from
* the code accompanying the book Make: AVR Programming by Elliot Williams,
* a great book and a pleasant read, that helped me tremendously to get
* started with AVR programming.
* ATTRIBUTION: This project includes the module lcdroutines from
* http://www.mikrocontroller.net/articles/AVR-GCC-Tutorial/LCD-Ansteuerung
*/
#include <stdbool.h>
#include <stdio.h>
#include <string.h>
#include <avr/io.h>
#include <avr/interrupt.h>
#include <avr/sleep.h>
#include <util/delay.h>
#include "USART.h"
#include "avrjunit.h"
#include "interrupts.h"
#include "adc.h"
#include "integers.h"
#include "sensors.h"
#include "display.h"
#include "pins.h"
#include "command.h"
#include "strings.h"
static const tableEntry testTable[] = {
{10, 10},
{20, 20}
};
/* Module interrupts */
bool testSetupPorts(void) {
setupPorts();
// test that the pull-up resistor for the mouton is enabled
assertTrue(bit_is_set(PORTB, PB0));
// test that the beep output pin is enabled
assertTrue(bit_is_set(DDRB, PB1));
return true;
}
bool testSetupSleepMode(void) {
setupSleepMode();
// set_sleep_mode(SLEEP_MODE_IDLE);
assertFalse(bit_is_set(SMCR, SM2));
assertFalse(bit_is_set(SMCR, SM1));
assertFalse(bit_is_set(SMCR, SM0));
return true;
}
bool testInitInterrupts(void) {
initInterrupts();
// ADC interrupt enabled
assertTrue(bit_is_set(ADCSRA, ADIE));
// PC interrupts enabled
// assertTrue(bit_is_set(PCICR, PCIE0));
// assertTrue(bit_is_set(PCMSK0, PB0));
// enable timer 0 overflow interrupt
assertTrue(bit_is_set(TIMSK0, TOIE0));
// USART RX complete interrupt 0 enabled
assertTrue(bit_is_set(UCSR0B, RXCIE0));
// sei(); // enable global interrupts
assertTrue(bit_is_set(SREG, SREG_I));
return true;
}
bool testInitTimers(void) {
initInterrupts();
// timer0 clock prescaler /64 = 15.625 kHz overflowing every 16.2 ms
uint8_t prescalerBy64 = (1 << CS00) | (1 << CS01);
assertTrue((TCCR0B & prescalerBy64) == prescalerBy64);
// timer1 Clear Timer on Compare Match mode, TOP OCR1A
assertTrue(bit_is_set(TCCR1B, WGM12));
// timer1 clock prescaler/8
assertTrue(bit_is_set(TCCR1B, CS11));
// toggles PB1 at 7.8 kHz generating a 3.9 kHz beep
// assertTrue(OCR1A == 16);
// 1.8 kHz is less noisy on the small piezo beeper
assertTrue(OCR1A == 32);
return true;
}
/* Module adc */
bool testSetupADC(void) {
setupADC();
// AVCC is set as AREF
assertTrue(bit_is_set(ADMUX, REFS0));
// digital inputs are disabled
uint8_t adcPorts = (1 << ADC_TEMPI) | (1 << ADC_TEMPO) | (1 << ADC_LAMBDA);
assertTrue((DIDR0 & adcPorts) == adcPorts);
// ADC clock prescaler/8
uint8_t prescalerBy8 = (1 << ADPS1) | (1 << ADPS0);
assertTrue((ADCSRA & prescalerBy8) == prescalerBy8);
// ADC enabled
assertTrue(bit_is_set(ADCSRA, ADEN));
return true;
}
bool testGetVoltage(void) {
initInterrupts();
setupADC();
setupSleepMode();
// enable pull-up resistor so the measured voltage
// should be close to AREF
PORTC |= (1 << PC1);
uint16_t mV = getVoltage(PC1);
return mV > 4900;
}
/* Module integers */
bool testDivRoundNearest(void) {
assertTrue(divRoundNearest(4, 2) == 2);
assertTrue(divRoundNearest(5, 2) == 3);
assertTrue(divRoundNearest(10, 3) == 3);
return true;
}
bool testDivRoundNearestNumNeg(void) {
assertTrue(divRoundNearest(-4, 2) == -2);
assertTrue(divRoundNearest(-5, 2) == -3);
assertTrue(divRoundNearest(-10, 3) == -3);
return true;
}
bool testDivRoundNearestDenNeg(void) {
assertTrue(divRoundNearest(4, -2) == -2);
assertTrue(divRoundNearest(5, -2) == -3);
assertTrue(divRoundNearest(10, -3) == -3);
return true;
}
bool testDivRoundNearestBothNeg(void) {
assertTrue(divRoundNearest(-4, -2) == 2);
assertTrue(divRoundNearest(-5, -2) == 3);
assertTrue(divRoundNearest(-10, -3) == 3);
return true;
}
bool testDivRoundUp(void) {
assertTrue(divRoundUp(4, 2) == 2);
assertTrue(divRoundUp(5, 2) == 3);
assertTrue(divRoundUp(10, 3) == 4);
return true;
}
bool testDivRoundUpNumNeg(void) {
assertTrue(divRoundUp(-4, 2) == -2);
assertTrue(divRoundUp(-5, 2) == -3);
assertTrue(divRoundUp(-10, 3) == -4);
return true;
}
bool testDivRoundUpDenNeg(void) {
assertTrue(divRoundUp(4, -2) == -2);
assertTrue(divRoundUp(5, -2) == -3);
assertTrue(divRoundUp(10, -3) == -4);
return true;
}
bool testDivRoundUpBothNeg(void) {
assertTrue(divRoundUp(-4, -2) == 2);
assertTrue(divRoundUp(-5, -2) == 3);
assertTrue(divRoundUp(-10, -3) == 4);
return true;
}
/* Module sensors */
bool testMeasure(void) {
setupADC();
setupSleepMode();
// enable pull-up resistor so the measured voltage
// should be close to AREF
PORTC |= ((1 << ADC_TEMPI) | (1 << ADC_TEMPO) | (1 << ADC_LAMBDA));
// do many measurements so the averaged voltages are near the measured
// voltages (close to AREF)
measurement meas;
for (uint8_t i = 0; i < 64; i++) {
meas = measure();
}
// verify that temperatures and lambda are calculated correctly
// for voltages > 4950 and <= 5000 mV
assertTrue(meas.tempI > 990 && meas.tempI <= 1000);
assertTrue(meas.tempO == 400);
assertTrue(meas.lambda == 997);
return true;
}
bool testToLambdaValue(void) {
int16_t lambda = toLambda(132);
return lambda == 1500;
}
bool testToLambdaInter(void) {
int16_t lambda = toLambda(550);
return lambda == 1073;
}
bool testToTempI(void) {
int16_t temp = toTempI(100);
return temp == 20;
}
bool testToTempOValue(void) {
int16_t temp = toTempO(454);
return temp == 0;
}
bool testToTempOInter(void) {
int16_t temp = toTempO(929);
return temp == 50;
}
bool testLookupLinInterBelow(void) {
int16_t value = lookupLinInter(0, testTable, 2);
return value == 10;
}
bool testLookupLinInterAbove(void) {
int16_t value = lookupLinInter(30, testTable, 2);
return value == 20;
}
bool testLookupLinInterValue(void) {
int16_t value = lookupLinInter(10, testTable, 2);
return value == 10;
}
bool testLookupLinInterInter(void) {
int16_t value = lookupLinInter(15, testTable, 2);
return value == 15;
}
bool testToInfoLean(void) {
const char* info = toInfo(191);
return ! strcmp(info, LEAN);
}
bool testToInfoOkay(void) {
assertTrue(0 == strcmp(toInfo(190), OKAY));
assertTrue(0 == strcmp(toInfo(170), OKAY));
assertTrue(0 == strcmp(toInfo(151), OKAY));
return true;
}
bool testToInfoIdeal(void) {
assertTrue(0 == strcmp(toInfo(150), IDEAL));
assertTrue(0 == strcmp(toInfo(140), IDEAL));
assertTrue(0 == strcmp(toInfo(130), IDEAL));
return true;
}
bool testToInfoRich(void) {
const char* info = toInfo(129);
return ! strcmp(info, RICH);
}
/* Module display */
// TODO assertions
bool testCycle(void) {
cycleDisplay();
return true;
}
// TODO assertions
bool testUpdateInitial(void) {
return true;
}
// TODO assertions
bool testUpdate(void) {
measurement meas = {0, 0, 0};
updateMeas(meas);
return true;
}
// TODO test display() with no display connected?
bool testDisplay(void) {
measurement meas = {0, 0, 0};
displayMeas(meas, " ");
return true;
}
/* Module command */
bool testIsSimulation(void) {
assertFalse(isSimulation());
runCommand("se");
assertTrue(isSimulation());
runCommand("sd");
assertFalse(isSimulation());
return true;
}
bool testIsLogging(void) {
assertFalse(isLogging());
runCommand("le");
assertTrue(isLogging());
runCommand("ld");
assertFalse(isLogging());
return true;
}
/* Module strings */
bool testSplit(void) {
char* string = "f1 f2 f3 ";
char* fields[4];
split(string, " ", fields, 4);
assertTrue(strcmp("f1", fields[0]) == 0);
assertTrue(strcmp("f2", fields[1]) == 0);
assertTrue(strcmp("f3", fields[2]) == 0);
assertTrue(strcmp("", fields[3]) == 0);
return true;
}
/*
* Whoa. Trying to write more elements than its size in the fields array
* seems to cause the AVR to reset and rerun the tests in an infinite loop.
*/
bool testSplitSizeTooSmall(void) {
char* string = "f1 f2";
char* fields[1];
split(string, " ", fields, 1);
assertTrue(strcmp("f1", fields[0]) == 0);
return true;
}
// TODO these long function names passed along as strings use a lot of memory
// use PROGMEM?
test tests[] = {
{"interrupts", "testSetupPorts", testSetupPorts},
{"interrupts", "testSetupSleepMode", testSetupSleepMode},
{"interrupts", "testInitInterrupts", testInitInterrupts},
{"interrupts", "testInitTimers", testInitInterrupts},
{"adc", "testSetupADC", testSetupADC},
{"adc", "testGetVoltage", testGetVoltage},
{"integers", "testDivRoundNearest", testDivRoundNearest},
{"integers", "testDivRoundNearestNumNeg", testDivRoundNearestNumNeg},
{"integers", "testDivRoundNearestDenNeg", testDivRoundNearestDenNeg},
{"integers", "testDivRoundNearestBothNeg", testDivRoundNearestBothNeg},
{"integers", "testDivRoundUp", testDivRoundUp},
{"integers", "testDivRoundUpNumNeg", testDivRoundUpNumNeg},
{"integers", "testDivRoundUpDenNeg", testDivRoundUpDenNeg},
{"integers", "testDivRoundUpBothNeg", testDivRoundUpBothNeg},
{"sensors", "testMeasure", testMeasure},
{"sensors", "testToLambdaValue", testToLambdaValue},
{"sensors", "testToLambdaInter", testToLambdaInter},
{"sensors", "testToTempI", testToTempI},
{"sensors", "testToTempOValue", testToTempOValue},
{"sensors", "testToTempOInter", testToTempOInter},
{"sensors", "testLookupLinInterValue", testLookupLinInterValue},
{"sensors", "testLookupLinInterInter", testLookupLinInterInter},
{"sensors", "testLookupLinInterBelow", testLookupLinInterBelow},
{"sensors", "testLookupLinInterAbove", testLookupLinInterAbove},
{"sensors", "testToInfoLean", testToInfoLean},
{"sensors", "testToInfoOkay", testToInfoOkay},
{"sensors", "testToInfoIdeal", testToInfoIdeal},
{"sensors", "testToInfoRich", testToInfoRich},
{"display", "testCycle", testCycle},
{"display", "testUpdateInitial", testUpdateInitial},
{"display", "testUpdate", testUpdate},
{"display", "testDisplay", testDisplay},
{"command", "testIsSimulation", testIsSimulation},
{"command", "testIsLogging", testIsLogging},
{"strings", "testSplit", testSplit},
{"strings", "testSplitSizeTooSmall", testSplitSizeTooSmall}
};
int main(void) {
initUSART();
uint16_t count = sizeof(tests) / sizeof(tests[0]);
runTests("lambda", tests, count);
return 0;
}